Screening Specs

Military Grade Hybrid Microcircuit
(M Grade)
Screening Specifications (Tcase = 85°C)

Test
Procedure
MIL-STD-883
Method
MIL-STD-883
Condition
Detail
Requirements
MDI
Screening
Internal Visual 2017 Same
Temperature Cycling 1010 B -55°C to +125°C
10 Cycles
Same
Mechanical Shock or Constant Acceleration 2002 and
2001
B1 Y1 Only
A1 Y1 Only
1500Gs
5000 Gs
Constant Acceleration
500 Gs standard1
Electrical Test Functional Test Same
Burn-in (85°C) 1015 85°C Tcase
160 hrs2 (Max. applied voltage and current)
Same
(Nominal input voltage and 100% rated load)
Final Electrical Test MDI ATP
PDA = 10%
Same
-55°C, 25°C, 85°C testing with data2
Fine Leak 1014 A1 or A2 Dependent on Vacant Interior Cavity of Hybrid Same
Gross Leak 1014 C1 Same
External Visual 2009 Same

Note 1 — Higher acceleration test levels available: Consult factory.
Note 2 — Industrial Grade Converters: 24 hours burn-in, 25°C test data only.

Military Grade Hybrid Microcircuit
(E Grade)
Screening Specifications (Tcase = 125°C)

Test
Procedure
MIL-STD-883
Method
MIL-STD-883
Condition
Detail
Requirements
MDI
Screening
Internal Visual 2017 Same
Temperature Cycling 1010 B -55°C to +125°C
10 Cycles
Same
Mechanical Shock or Constant Acceleration 2002 and
2001
B1 Y1 Only
A1 Y1 Only
1500Gs
5000 Gs
Constant Acceleration 500 Gs standard1
Electrical Test Functional Test Same
Burn-in (125°C) 1015 125°C Tcase
160 hrs (Max. applied voltage and current)
Same
(Nominal input voltage and 100% rated load)
Final Electrical Test MDI ATP
PDA = 10%
Same
-55°C, 25°C, 125°C testing with data
Fine Leak 1014 A1 or A2 Dependent on Vacant Interior Cavity of Hybrid Same
Gross Leak 1014 C1 Same
External Visual 2009 Same

Note 1 — Higher acceleration test levels available: Consult factory.

Space Grade Hybrid Microcircuit
(S Grade)
Screening Specifications (Tcase = 85°C)

Test
Procedure
MIL-STD-883
Method
MIL-STD-883
Condition
Detail
Requirements
MDI
Screening
Nondestruct
Bond Pull
2023 100% Wires
2% PDA
Same
Internal Visual 2017 Same
Temperature Cycling 1010 B -55°C to +125°C
10 Cycles
Same
Mechanical Shock or Constant Acceleration 2002 and
2001
B1 Y1 Only
A1 Y1 Only
1500Gs
5000 Gs
Constant Acceleration
500 Gs standard1
Pind 2020 B 10 Gs, 60 HZ Same
Electrical Test Functional Test Same
Burn-in (85°C) 1015 N/A
(Maximum applied voltage and current)
85°C Tcase 320 hrs
(Nominal input voltage and 100% rated load)
Final Electrical Test MDI ATP
PDA = 2% or 1 device
Same
-55°C, 25°C, 85°C testing with data
Fine Leak 1014 A1 or A2 Dependent on Vacant Interior Cavity of Hybrid Same
Gross Leak 1014 C1 Same
Radiography 2012 Y Direction Same
External Visual 2009 Same

Note 1 — Higher acceleration test levels available: Consult factory.

Space Grade Hybrid Microcircuit
(SE Grade)
Screening Specifications (Tcase = 125°C)

Test
Procedure
MIL-STD-883
Method
MIL-STD-883
Condition
Detail
Requirements
MDI
Screening
Nondestruct
Bond Pull
2023 100% Wires
2% PDA
Same
Internal Visual 2017 Same
Temperature Cycling 1010 B -55°C to +125°C
10 Cycles
Same
Mechanical Shock or Constant Acceleration 2002 and
2001
B1 Y1 Only
A1 Y1 Only
1500Gs
5000 Gs
Constant Acceleration
500 Gs standard1
Pind 2020 B 10 Gs, 60 HZ Same
Electrical Test Functional Test Same
Burn-in (125°C) 1015 125°C Tcase 320 hrs
(Maximum applied voltage and current)
Same
(Nominal input voltage and 100% rated load)
Final Electrical Test MDI ATP
PDA = 2% or 1 device
Same
-55°C, 25°C, 125°C testing with data
Fine Leak 1014 A1 or A2 Dependent on Vacant Interior Cavity of Hybrid Same
Gross Leak 1014 C1 Same
Radiography 2012 Y Direction Same
External Visual 2009 Same

Note 1 — Higher acceleration test levels available: Consult factory.