Military Grade Hybrid Microcircuit
(M Grade)
Screening Specifications (Tcase = 85°C)
| Test Procedure |
MIL-STD-883 Method |
MIL-STD-883 Condition |
Detail Requirements |
MDI Screening |
|---|---|---|---|---|
| Internal Visual | 2017 | — | — | Same |
| Temperature Cycling | 1010 | B | -55°C to +125°C 10 Cycles |
Same |
| Mechanical Shock or Constant Acceleration | 2002 and 2001 |
B1 Y1 Only A1 Y1 Only |
1500Gs 5000 Gs |
Constant Acceleration 500 Gs standard1 |
Pind | 2020 | B | 10 Gs, 60 HZ | Same |
| Electrical Test | — | — | Functional Test | Same |
| Burn-in (85°C) | 1015 | — | 85°C Tcase 160 hrs2 (Max. applied voltage and current) |
Same (Nominal input voltage and 100% rated load) |
| Final Electrical Test | — | — | MDI ATP PDA = 10% |
Same -55°C, 25°C, 85°C testing with data2 |
| Fine Leak | 1014 | A1 or A2 | Dependent on Vacant Interior Cavity of Hybrid | Same |
| Gross Leak | 1014 | C1 | — | Same |
| External Visual | 2009 | — | — | Same |
Note 1 — Higher acceleration test levels available: Consult factory.
Note 2 — Industrial Grade Converters: 24 hours burn-in, 25°C test data only.
Military Grade Hybrid Microcircuit
(E Grade)
Screening Specifications (Tcase = 125°C)
| Test Procedure |
MIL-STD-883 Method |
MIL-STD-883 Condition |
Detail Requirements |
MDI Screening |
|---|---|---|---|---|
| Internal Visual | 2017 | — | — | Same |
| Temperature Cycling | 1010 | B | -55°C to +125°C 10 Cycles |
Same |
| Mechanical Shock or Constant Acceleration | 2002 and 2001 |
B1 Y1 Only A1 Y1 Only |
1500Gs 5000 Gs |
Constant Acceleration 500 Gs standard1 | Pind | 2020 | B | 10 Gs, 60 HZ | Same |
| Electrical Test | — | — | Functional Test | Same |
| Burn-in (125°C) | 1015 | — | 125°C Tcase 160 hrs (Max. applied voltage and current) |
Same (Nominal input voltage and 100% rated load) |
| Final Electrical Test | — | — | MDI ATP PDA = 10% |
Same -55°C, 25°C, 125°C testing with data |
| Fine Leak | 1014 | A1 or A2 | Dependent on Vacant Interior Cavity of Hybrid | Same |
| Gross Leak | 1014 | C1 | — | Same |
| External Visual | 2009 | — | — | Same |
Note 1 — Higher acceleration test levels available: Consult factory.
Space Grade Hybrid Microcircuit
(S Grade)
Screening Specifications (Tcase = 85°C)
| Test Procedure |
MIL-STD-883 Method |
MIL-STD-883 Condition |
Detail Requirements |
MDI Screening |
|---|---|---|---|---|
| Nondestruct Bond Pull |
2023 | — | 100% Wires 2% PDA |
Same |
| Internal Visual | 2017 | — | — | Same |
| Temperature Cycling | 1010 | B | -55°C to +125°C 10 Cycles |
Same |
| Mechanical Shock or Constant Acceleration | 2002 and 2001 |
B1 Y1 Only A1 Y1 Only |
1500Gs 5000 Gs |
Constant Acceleration 500 Gs standard1 |
| Pind | 2020 | B | 10 Gs, 60 HZ | Same |
| Electrical Test | — | — | Functional Test | Same |
| Burn-in (85°C) | 1015 | — | N/A (Maximum applied voltage and current) |
85°C Tcase 320 hrs (Nominal input voltage and 100% rated load) |
| Final Electrical Test | — | — | MDI ATP PDA = 2% or 1 device |
Same -55°C, 25°C, 85°C testing with data |
| Fine Leak | 1014 | A1 or A2 | Dependent on Vacant Interior Cavity of Hybrid | Same |
| Gross Leak | 1014 | C1 | — | Same |
| Radiography | 2012 | — | Y Direction | Same |
| External Visual | 2009 | — | — | Same |
Note 1 — Higher acceleration test levels available: Consult factory.
Space Grade Hybrid Microcircuit
(SE Grade)
Screening Specifications (Tcase = 125°C)
| Test Procedure |
MIL-STD-883 Method |
MIL-STD-883 Condition |
Detail Requirements |
MDI Screening |
|---|---|---|---|---|
| Nondestruct Bond Pull |
2023 | — | 100% Wires 2% PDA |
Same |
| Internal Visual | 2017 | — | — | Same |
| Temperature Cycling | 1010 | B | -55°C to +125°C 10 Cycles |
Same |
| Mechanical Shock or Constant Acceleration | 2002 and 2001 |
B1 Y1 Only A1 Y1 Only |
1500Gs 5000 Gs |
Constant Acceleration 500 Gs standard1 |
| Pind | 2020 | B | 10 Gs, 60 HZ | Same |
| Electrical Test | — | — | Functional Test | Same |
| Burn-in (125°C) | 1015 | — | 125°C Tcase 320 hrs (Maximum applied voltage and current) |
Same (Nominal input voltage and 100% rated load) |
| Final Electrical Test | — | — | MDI ATP PDA = 2% or 1 device |
Same -55°C, 25°C, 125°C testing with data |
| Fine Leak | 1014 | A1 or A2 | Dependent on Vacant Interior Cavity of Hybrid | Same |
| Gross Leak | 1014 | C1 | — | Same |
| Radiography | 2012 | — | Y Direction | Same |
| External Visual | 2009 | — | — | Same |
Note 1 — Higher acceleration test levels available: Consult factory.